Bloomy Controls, Inc - Case Studies

See Curve Trace System IC Characterization Product Brochure

Bloomy Controls' Curve Trace System utilizes the latest hardware and software technologies to provide a high density, high speed, fully automated IC characterization system.

Automated Resistance Mapping of LGA Chip Module Contact Grid

Challenge: Verify uniform force distribution and quality of electrical connectivity on a pressurized Land Grid Array (LGA) interposer. Automate a time-consuming and physically prohibitive process involving substantial measurement, data recording, and data presentation effort.

LabVIEW Speeds Development of CMP Semiconductor Fabrication Control System (pdf)

Challenge: Facilitate parallel development and debugging while critical system hardware, a sensor-based data receiver, is being developed.

LabVIEW and IMAQ Control Production of Solder Spheres (pdf)

Challenge: Increase the yield of high-quality solder spheres manufactured.


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		"Bloomy Controls performed exceedingly well in the delivery of the engineering services we required from them. Beyond that, they also demonstrated sensitivity and flexibility to the unique environment and needs of our project and our client. Bloomy's contributions made the difference between a very successful project, and a very troubled one." Michael J. Prevost CEO Dot4 Inc.