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Automotive Testing Expo 2017

Tuesday, October 24, 2017 - 12:00am to Thursday, October 26, 2017 - 11:45pm

Location

The Suburban Collection Showplace
46100 Grand River
Novi, MI 48374
United States
See map: Google Maps

Steven Hoenig, Bloomy's Battery Test and Simulation Unit Manager to present at the Open Tech Forum.

An Open Systems Architecture Approach to BMS HIL Testing
Date: October 26 (day 3)
Time: 12:20 - 12:40pm
Location: Hall B
Presentation Length: 20 min.

Hardware-in-the-loop (HIL) testing is the standard approach to validating the design of xEV systems including the battery management system (BMS) electronics and firmware. HIL test systems are used to simulate the battery, including cell chemistry, charging and discharging, drive cycles and numerous fault conditions for testing the BMS. There exist vendor-defined or 'closed', as well as user-defined or 'open', approaches to the implementation of HIL test equipment. Bloomy presents an open systems architecture approach to HIL test systems implementation using commercial off-the-shelf hardware and software. The presentation will outline the benefits of this approach, which include greater flexibility, extensibility and reduced cost.

Visit Bloomy at National Instrument's booth #1000 in the exhibition hall.  Bloomy will showcase the following products:

  • The Battery Simulator 1200 is a 12-cell simulator that is the building block of all of Bloomy’s BMS test systems. Each cell has individually programmable voltage levels and current limits, 1,000 V of isolation, and can dynamically sink and source current similar to a real battery.
     
  • The Battery Fault Insertion Unit (FIU) provides intelligent switching of cell-simulation channels for the Battery Simulator 1200. The switching capability enables simulation of open-circuit and short-to-rail fault conditions on any cell channel for the purposes of battery management system (BMS) testing.
     
  • A desktop demonstration version of the BMS HIL Test System simulates a complete battery pack in order to test the BMS in real time. It is ideal for iteratively testing and optimizing BMS firmware, including cell balancing algorithms, SOC, SOH, safety interlocks, and many more conditions.

Visit the event website: http://www.testing-expo.com/usa/