Location
This year at the Bloomy pavilion, booth #205 of the exhibition hall, Bloomy will showcase five innovative product demonstrations:
NI HIL Simulator System
Electronics Functional Test (EFT) Module for TestStand
BMS HIL Test System
UTS Functional Tester
cUTS Functional Tester
In addition, Bloomy will present the following technical sessions at this year's event:
An Open Systems Architecture Approach to BMS HIL Testing
Session ID: 0918
Date: Tuesday, May 23rd
Time: 4:45-5:45 p.m.
Room: 13 A/B
Track: Data Acquisition Systems
Presented by: BTS Business Unit Manager, Steven Hoenig
Understanding the benefits of an open-systems approach, and how commercial-off-the-shelf hardware and software by Bloomy and NI can be used to facilitate this approach to ensure success in BMS design.
Personalizing TestStand With Custom Step Types
Session ID: 0894
Date: Wednesday, May 24th
Time: 10:30-11:30 a.m.
Room: 12A
Track: Automated Test Systems
Presented by: Turnkey Systems Manager, Grant Gothing
Learn best practices and design patterns for TestStand Custom StepType development. Understand how they can be used to improve test development productivity.
Testing the Tester: Self-test Methods for Periodic ATE Verification
Session ID: 0531
Date: Thursday, May 25th
Time: 10:30-11:30 a.m.
Room: F
Track: Automated Test Systems
Presented by: Test Engineer, Jake Adams
Examine different methodologies for periodic system evaluation and learn the pros/cons and best practices of each method with respect to test coverage and implementation details.
Reuse in User Interfaces: Skinnable Views and Dynamic Events
Session ID: 0643
Date: Thursday, May 25th
Time: 12:45-1:45 p.m.
Room: 19B
Track: Software Development Techniques
Presented by: Project Engineer, Michael Palafox
Use Object-Oriented programming and dynamic events to create reusable user-interface components that minimize code-duplication while enabling consistent UIs.
For additional details, please visit NIWeek 2017