You are here

NIWeek 2017

Monday, May 22, 2017 to Thursday, May 25, 2017


Austin Convention Center
500 Cesar Chevez Street
Austin, TX 78701
United States

This year at the Bloomy pavilion, booth #205 of the exhibition hall, Bloomy will showcase five innovative product demonstrations:

  • NI HIL Simulator System

  • Electronics Functional Test (EFT) Module for TestStand

  • BMS HIL Test System

  • UTS Functional Tester

  • cUTS Functional Tester

In addition, Bloomy will present the following technical sessions at this year's event:

Personalizing TestStand With Custom Step Types
Session ID: 0894
Track: Automated Test Systems

Presented by: Turnkey Systems Manager, Grant Gothing

Learn best practices and design patterns for TestStand Custom StepType development. Understand how they can be used to improve test development productivity.

An Open Systems Architecture Approach to BMS HIL Testing
Session ID: 0918
Track: Data Acquisition Systems
Presented by: BTS Business Unit Manager, Steven Hoenig

Understanding the benefits of an open-systems approach, and how commercial-off-the-shelf hardware and software by Bloomy and NI can be used to facilitate this approach to ensure success in BMS design.

Testing the Tester: Self-test Methods for Periodic ATE Verification
Session ID: 0531
Track: Automated Test Systems
Presented by: Test Engineer, Jake Adams

Examine different methodologies for periodic system evaluation and learn the pros/cons and best practices of each method with respect to test coverage and implementation details.

Reuse in User Interfaces: Skinnable Views and Dynamic Events
Session ID: 0643
Track: Software Development Techniques
Presented by: Project Engineer, Michael Palafox

Use Object-Oriented programming and dynamic events to create reusable user-interface components that minimize code-duplication while enabling consistent UIs.

For additional details, please visit NIWeek 2017