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Visit Bloomy at NIWeek 2015!

Wednesday, July 1, 2015

The talented staff at Bloomy are preparing for another extraordinary showing at NIWeek 2015, August 3rd-6th at the Austin Convention Center in Austin, TX. The Company is presenting four technical sessions, as well as five innovative product demonstrations, as it builds upon several key themes initiated at last year’s show.

Exhibits

Visit the Bloomy pavilion, booth #205 of the exhibition hall, and participate in interactive product demonstrations, learn about best practices, or enter a drawing to win a $100 cash prize. Check out our showcased products and platforms with applications in real-time or hardware-in-the-loop (HIL) testing, printed circuit board assembly (PCBA) functional testing, and LabVIEW agile development processes.

  • The Cockpit Data Collector Validation System implements a real-time, deterministic hardware-in-the-loop (HIL) validation test for a simulated helicopter data collection system. The demo utilizes Bloomy’s own MIL-STD-1553B C-series module for NI CompactRIO. 

  • The Desktop BMS HIL Test System performs firmware regression testing of battery management systems (BMSs) by simulating the characteristics of advanced Li-Ion batteries.

  • The Electronics Functional Test exhibit demonstrates the UTS Software Suite’s seamless transitioning of a PCBA unit under test between Bloomy’s PXI-based UTS and the USB-based compactUTS, to perform verification testing on both stations with zero software changes. The benefits of uniform software with hardware abstraction and a common user interface are clearly conveyed.

  • Agile-In-Action demonstrates the incredible results that are achieved in an extremely short period of time when OEMs partner with Bloomy to develop products employing agile processes. In this exhibit, Idex Health and Sciences of Middleboro, MA, partnered with Bloomy to develop a Fluidics Development Kit for the control of microfluidic devices. The product was developed from inception to beta in just four two-week agile code sprints. Equally incredible, the software is an integrated development environment or “IDE”, complete with dynamic device discovery, a custom interpreted scripting language, and a visual workspace - all developed using LabVIEW!

Presentations

Bloomy engineers will present at the following technical sessions:

TS7760 - From the Experts: Automated Test Best Practices

Wednesday, August 5, from 10:30 – 11:30 am
Location: Room 11A/B
Contributing Bloomy Expert, Turnkey Systems Manager, Grant Gothing

This session provides some best practices for building automated test systems from leading experts and covers the full test process from analyzing test requirements and developing the tester architecture to optimizing test throughput and deploying test systems.

TS7737 - Energy Storage Performance Testing with Megawatt Scalability

Wednesday, August 5, from 3:30 – 4:00 pm
Location: BallroomG

By Bloomy's President, Peter Blume
This session examines the energy storage system data acquisition and control (ESS DAC) system used to test ESSs at the Battery and Energy Storage Technology (BEST) Test and Commercialization Center in Rochester, NY. This system performs functional, performance, and applications testing of ESSs from 1 kW to more than 2 MW. This session includes an overview of the system architecture and explores a recent test scenario for community ESS testing with recycled batteries.

TS5740 - Computer Science for the G Programmer, Year 2

Thursday, August 6, from 10:30 – 11:30 am
Location: Room 19A
By Bloomy's Senior LabVIEW Architect and LabVIEW Champion, Jon McBee and NI's Senior Software Engineer, Stephen Loftus-Mercer

Previously at NIWeek 2014, this session studied two of the five S.O.L.I.D principles with LabVIEW. Now Stephen Mercer and Jon McBee are back for another pair: interface segregation and dependency inversion. Last year's presentation is not a prerequisite to attend this year. The aim is to help LabVIEW users write better software by understanding architecture fundamentals from computer science.

TS7757 - Maximizing ATE Hardware Abstraction with NI TestStand

Thursday, August 6, from 2:00 – 3:00 pm
Location: Room 11A/B
By Bloomy's Turnkey Systems Manager, Grant Gothing and Senior Project Engineer, Hector Guajardo Betancourt

This session is a deep dive into the concepts and benefits of hardware abstraction and how implementing a hardware abstraction layer (HAL) can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, minimizing development effort, helping you to maintain ATE for years to come.