Learn about the key components to building test systems from start to finish in this four-part interactive webinar series.
Part I: What I Wish I Had Known Before I Started Deploying Test Systems
Presenter: James Kostinden of Bose Corporation
Time: September 27th at 10:00 CT
Part II: Switching, Mass Interconnect, and Fixturing Considerations
Presenter: David Roohy of National Instruments
Time: September 27th at Noon CT
Part III: Improving ATE Test Sequence Adaptability Using HALs and MALs
Presenter: Grant Gothing of Bloomy
Time: September 28th at 10:00 CT
Join Grant as he presents part three of this four-part interactive webinar series on how using Hardware abstraction layers (HALs) and measurement abstraction layers (MALs) save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, and lessening development effort. See common options for implementing HALs and MALs, from out-of-the-box drivers to object-oriented solutions, to find the right scope of abstraction for your needs.
Part IV: Thermal and Power Planning of Automated Test Systems
Presenter: Patrick Robinson of National Instruments
Time: September 28th at Noon CT
For full details on webcast topics and system requirements please visit Fundamentals of Building a Test System Webinar Series on National Instruments website.