Location
At this year's event, Bloomy’s Turnkey Systems Manager, Grant Gothing will present:
Maximizing ATE Hardware Abstraction with NI TestStand
Tuesday, November 17, 11:30 am-12:15 pm in room #110
This session is a deep dive into the concepts and benefits of hardware abstraction and how implementing a hardware abstraction layer (HAL) can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, minimizing development effort, helping you to maintain ATE for years to come.
Visit Bloomy at booth #300 to view demonstrations on the following products and platforms:
The Cockpit Data Collector Validation System implements a real-time, deterministic hardware-in-the-loop (HIL) validation test for a simulated helicopter data collection system. The demo utilizes Bloomy’s own MIL-STD-1553B C-series module for NI CompactRIO.
- The Electronics Functional Test exhibit demonstrates the UTS Software Suite’s seamless transitioning of a PCBA unit under test between Bloomy’s PXI-based UTS and the USB-based compactUTS, to perform verification testing on both stations with zero software changes. The benefits of uniform software with hardware abstraction and a common user interface are clearly conveyed.