Location
At this year's event, Bloomy’s Turnkey Systems Manager, Grant Gothing will present:
Maximizing ATE Hardware Abstraction with NI TestStand
Tuesday, December 8, 11:00 am-11:45 am, Room 231B
This session is a deep dive into the concepts and benefits of hardware abstraction and how implementing a hardware abstraction layer (HAL) can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, minimizing development effort, helping you to maintain ATE for years to come.
Visit Bloomy at booth #609B to see a demonstration of our compactUTSTM (cUTS) and UTS Software Suite testing a typical electronic device. The cUTS is a cost-effective platform for high product mix, low-to-medium volume automated functional testing of devices with fewer than fifty cable-accessible test points. As device or test complexity increases, the UTS Software Suite’s hardware abstraction facilitates seamless migration to Bloomy’s PXI-based UTSTM functional test platform, providing many other fixturing options, including bed-of-nails.
Please join us!