Location
This year at the Bloomy pavilion, booth #205 of the exhibition hall, Bloomy will showcase four innovative product demonstrations:
NI HIL Simulator System
Electronics Functional Test (EFT) Module for TestStand
BMS HIL Test System
cUTS Functional Tester
In addition, Bloomy will present the following technical sessions at this year's event:
Eliminate Point-to-Point Wiring to Reduce Cost, Time, and Risk
Session ID: 1283
Date: Tuesday, May 22nd
Time: 4:45 - 5:45 pm
Location: Room 12A
Presented by: Program Manager, Real-Time Test, Steven Hoenig
Join Steven and learn how one can accelerate the construction of systems that are well organized and easy to maintain with lower cost, lead time, and risk.
Bloomy's EFT Helps Bose BEAT Down the Cost of Test Develoment
Session ID: 1228
Date: Thursday, May 24th
Time: 1:45 - 2:45 pm
Location: Room 16A
Presented by: Chief Technology Officer, Grant Gothing of Bloomy and Lead Software Test Engineer/Manager, Jim Kostinden of Bose Corporation
Join Grant and Jim as they explain how they combined their architectures (Bloomy's commercial EFT Module and Bose's proprietary BEAT) to increase their capabilities, shorten development, and expand the overall TestStand user base.
SLSC Sensor Simulations for HIL in Mil/Aero Applications
Session ID: 1344
Date: Thursday, May 24th
Time: 1:45 - 2:45 pm
Location: Room 12A
Presented by: Principal Electrical Engineer, Bill Eccles
Join Bill as he describes the SLSC technology enabling its variable differential transformer, thermocouple, discrete, and load simulations.
Running in Circles: Digital Pattern Generation
Session ID: 1504
Date: Thursday, May 24th
Time: 3:00 - 4:00 pm
Location: Room 12B
Presented by: Senior Software Architect, Ryan Vallieres
Join Ryan as he explores implementing your own DDS engine in FPGAs.
For additional details, please visit NIWeek 2018