You are here

Electronics

Easing Development with DLLs in LabVIEW

March 2, 2017

As LabVIEW developers, we are comfortable developing in LabVIEW. However, sometimes we need to leverage code from other languages. This is where DLLs come in. For those of us that are less than comfortable with coding languages outside of LabVIEW, using DLLs can be daunting and frustrating. The Import Shared Library Wizard can make your life easier, however, it is not very reliable when using custom data types. This forces us to use Call Library Function nodes (CLNs) for DLL calls, which can bring up a whole bunch of problems with no intuitive debug strategy.

Category:
LabVIEW

Faster time to solution for Electronics Functional Test

The Bloomy Electronics Functional Test (EFT) Module for TestStand is a set of tools for electronics functional test sequence development, execution, and result processing using NI TestStand.

The design and development of automated test equipment (ATE) presents a host of challenges, from initial planning through hardware and software development to final integration. At each stage of the process, changes become more difficult and costly to implement. Furthermore, because software typically follows hardware in the development cycle, many open-ended items are left for the software engineer to handle.

Do you maintain multiple test systems or develop test sequences for a wide range of products? Have you ever experienced the hassles of instrumentation or platform changes? If so, hardware and measurement abstraction layers (HAL & MALs) can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, and reducing development effort.  In this session Grant Gothing, Bloomy's Automated Test Equipment (ATE) R&D Manager, describes the benefits and challenges of abstraction in ATE.

This presentation describes the benefits of a universal approach to automated functional test. This approach will help you lower the overall long-term cost of functional test, improve your reliability, and allow your test solution to grow and adapt for years to come.

Author: Grant Gothing, ATE Business Unit Manager, Bloomy
All rights reserved.

 

These slides encompass part three of a three-part presentation given at the From the Experts: Automated Test Best Practices technical session and cover some best practices for code development and system deployment when building automated test systems.

Authors: Grant Gothing, Turnkey Systems Manager, Bloomy
Conference: NIWeek 2015, August 5, 2015, Austin, TX
All rights reserved.

This presentation is a deep dive into the concepts and benefits of hardware abstraction and how implementing a hardware abstraction layer (HAL) can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, and minimizing development effort, helping you to maintain ATE for years to come.

Authors: Grant Gothing, Turnkey Systems Manager, Bloomy and Hector Guajardo Betancourt, Senior Project Engineer, Bloomy
Conference: NIWeek 2015, August 6, 2015, Austin, TX
All rights reserved.

Pages

Subscribe to RSS - Electronics