The design and development of automated test equipment (ATE) presents a host of challenges, from initial planning through hardware and software development to final integration. At each stage of the process, changes become more difficult and costly to implement. Furthermore, because software typically follows hardware in the development cycle, many open-ended items are left for the software engineer to handle.
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Electronics Functional Test
The USB-based compactUTS (cUTS) is a benchtop mixed-signal functional tester designed for automated testing of electronic assemblies that are accessible via cable connections with fewer than fifty test points. Powered by NI USB instrumentation, a robust VPC i1 mass-interconnect jack and our own power control and switch matrix electronics, the cUTS is driven by a standard Windows PC or notebook computer running LabVIEW and TestStand. With full integration into the Bloomy UTS Software Suite, test engineers can develop automated test sequences which are easily scaled to modular PXI based sys
- Read more about Bloomy compactUTS Demonstration - NIWeek 2016
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Do you maintain multiple test systems or develop test sequences for a wide range of products? Have you ever experienced the hassles of instrumentation or platform changes? If so, hardware and measurement abstraction layers (HAL & MALs) can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, and reducing development effort. In this session Grant Gothing, Bloomy's Automated Test Equipment (ATE) R&D Manager, describes the benefits and challenges of abstraction in ATE.
NIWeek 2016 Technical Session 9890
Benefits of Universal Test for High-Mix Electronics Manufacturing
Functional Test Target: MRB PCBAs
April 4, 2016
The Material Review Board (MRB) usually consists of a meeting of personnel from Quality, Materials, Purchasing and Manufacturing engineering. The purpose of an MRB is to review rejected material for disposition. Disposition decisions are often made based on schedule requirements, material cost, availability of alternatives, or analysis of the defect. The MRB material of interest is Printed Circuit Board Assemblies (PCBAs).
- Read more about Functional Test Target: MRB PCBAs
- Rob Putala's blog
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This video presents the benefits of a universal approach to automated functional test. This approach will help you lower the overall long-term cost of functional test, improve your reliability, and allow your test solution to grow and adapt for years to come.
This presentation describes the benefits of a universal approach to automated functional test. This approach will help you lower the overall long-term cost of functional test, improve your reliability, and allow your test solution to grow and adapt for years to come.
Author: Grant Gothing, ATE Business Unit Manager, Bloomy
All rights reserved.
In this video Bloomy's Turnkey Systems Manager, Grant Gothing presents the concepts and benefits of hardware abstraction for automated test equipment (ATE) design. Implementing a hardware abstraction layer (HAL) with NI TestStand can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, and minimizing development effort, helping you to maintain ATE for years to come.
In this video Grant demonstrates the power of the UTS Functional Test Platform, including the UTS Software Suite, by seamlessly transitioning UUT verification testing from the entry-level USB-based cUTS to the modular, PXI-based UTS, with zero software changes. The demo specifically shows the benefits of a unified software approach, including hardware abstraction in TestStand, and a common test user interface.
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