Mike Watts, Product Manager with the Automated Test Group at National Instruments, delivers a brief introduction to "From the Experts: Automated Test Best Practices" at NIWeek 2015.
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Electronics Functional Test
Bloomy's Turnkey Systems Manager, Grant Gothing, shares some best practices for test code development and test system deployment at this extremely popular, standing-room-only session, during NIWeek 2015.
Bloomy's Turnkey Systems Manager, Grant Gothing, fields questions from a lively audience on automated test best practices at NIWeek 2015.
These slides encompass part three of a three-part presentation given at the From the Experts: Automated Test Best Practices technical session and cover some best practices for code development and system deployment when building automated test systems.
Authors: Grant Gothing, Turnkey Systems Manager, Bloomy
Conference: NIWeek 2015, August 5, 2015, Austin, TX
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This presentation is a deep dive into the concepts and benefits of hardware abstraction and how implementing a hardware abstraction layer (HAL) can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, and minimizing development effort, helping you to maintain ATE for years to come.
Authors: Grant Gothing, Turnkey Systems Manager, Bloomy and Hector Guajardo Betancourt, Senior Project Engineer, Bloomy
Conference: NIWeek 2015, August 6, 2015, Austin, TX
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The cost of manufacturing defects in electronic subassemblies increases precipitously as the subassemblies progress through production and become integrated into final product assemblies. Automated subassembly functional test is an effective means to identify defects prior to final product assembly, and dramatically improve final-line production yields. This results in a calculable reduction in labor and materials associated with identifying and resolving subassembly defects.
Economics of Electronic Subassembly Functional Test - ROI Spreadsheet
A companion to the Bloomy whitepaper “Economics of Electronic Subassembly Functional Test”, this handy spreadsheet calculates the Return On Investment (ROI) for applying automated functional test to electronic subassemblies including PCBAs, prior to final product assembly.
Bloomy's Turnkey Systems Manager, Grant Gothing, presents “Plan for Success with Automated Test” covering best practices for creating test requirements, specifying instrumentation, defining interconnects, and selecting the right software architecture.
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Planning for ATE Success at NIDays
January 13, 2015
Bloomy supported the automated test community with informative presentations and practical exhibits at NIDays North America conferences late in 2014. Turnkey Systems Manager Grant Gothing presented “Plan for Success with Automated Test” to standing-room-only crowds who learned best practices for creating test requirements, specifying instrumentation, defining interconnects, and selecting the right software architecture.
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- David Moschella's blog
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Test Procedure Template
This file contains a template for producing a test procedure that details the list stimuli, responses, and interpretations that must be implemented by the test system to produce the information that indicates a passed or failed test of a DUT.
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