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Automated Test

  

Hardware and measurement abstraction layers (HAL/MAL) generally have 3 types of users: test developers, power users and framework architects, each having potentially competing interests and objectives. While a tradeoff often exists between immediate usability, customizability, scalability, and level of abstraction, the success of a HAL/MAL is overwhelmingly determined by its adoption among test developers, who are by far the largest group of potential users. Learn how Bloomy's HAL/MAL developed for the EFT Module for TestStand strikes a balance between these three stakeholders.

  

Custom devices can be a powerful tool for real-time test in VeriStand, however, they present a unique set of challenges and constraints for the developer. In this video presentation learn tips and tricks for writing custom devices targeted at a robust user experience and efficient operation with a focus on creating testable, maintainable code.

This presentation was recorded at NIWeek in Austin, TX on May 21, 2019


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Simulation Systems

 

Learn about Simulation Systems, Bloomy's new test systems architecture comprised of COTS materials for hardware-in-the-loop (HIL) closed-loop as well as open-loop testing of aerospace, transportation and defense electronics.

In this video, a modular test systems architecture comprised of NI PXI, SLSC and Bloomy modules and accessories is clearly explained. This architecture has the following features:

EFT Module for TestStand 2016 Installer (v2.3.9)

This installer contains the EFT Module for TestStand 2016 version 2.3.9, including Hardware Access Framework, Manufacturing Operator Interface, Database Result Processing plugin, user manuals and example sequences.

Prerequisite Installations:

  • LabVIEW 2016 (32-bit), TestStand 2016 (32-bit)

NI Device Drivers:

  • NI-DAQmx 16.0
  • NI-SWITCH 16.0
  • NI-DMM 16.0
  • NI-VISA 16.0
  • NI-DC Power 16.0 (only required for execution of example sequence)

EFT 2.3.9 Release Notes:

 

In this video Bloomy's Principal Engineer, Bill Eccles explains how NI Switch, Load and Signal Conditioning (SLSC) provides an enabling technology that allows Bloomy to build simulation systems more completely and quickly using PXI, SLSC, standardized cables, and other components for our customer’s needs.

This presentation was recorded at NIWeek in Austin, TX on May 24, 2018


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SLSC and cRIO Modules and Accessories

A standardized TestStand architecture greatly reduces the cost and time of automated test. In this presentation learn how Bloomy and Bose Corporation combined their architectures (Bloomy's commercial EFT Module and Bose's proprietary BEAT) to increase their capabilities, shorten development, and expand the overall TestStand user base.

Presented by Grant Gothing at NIWeek in Austin, TX on May 24, 2018


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