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Automated Test

Presented by Peter Blume at the Advanced Automotive Battery Conference (AABC) 2016 in Detroit, MI

Hardware-In-the-Loop (HIL) testing is the standard approach to validating the design of xEV ECU systems including the battery management system (BMS) electronics and firmware. HIL test systems are used to simulate the battery including cell chemistry, charging and discharging, drive cycles, and numerous fault conditions for testing the BMS; without the hazards of real batteries, or the cost of prototype vehicles and track time.

This presentation describes the benefits of a universal approach to automated functional test. This approach will help you lower the overall long-term cost of functional test, improve your reliability, and allow your test solution to grow and adapt for years to come.

Author: Grant Gothing, ATE Business Unit Manager, Bloomy
All rights reserved.

 

In this video Grant demonstrates the power of the UTS Functional Test Platform, including the UTS Software Suite, by seamlessly transitioning UUT verification testing from the entry-level USB-based cUTS to the modular, PXI-based UTS, with zero software changes. The demo specifically shows the benefits of a unified software approach, including hardware abstraction in TestStand, and a common test user interface.

The key to accelerating development of electrified vehicle (xEV) batteries is to decouple the interdependencies which exist between development of battery management electronics and firmware, and the development of cells and packs. Advanced modeling, simulation, and test techniques can be used to develop the electronics and firmware concurrently with the cells and packs, thereby expediting xEV battery development cycles.

These slides encompass part three of a three-part presentation given at the From the Experts: Automated Test Best Practices technical session and cover some best practices for code development and system deployment when building automated test systems.

Authors: Grant Gothing, Turnkey Systems Manager, Bloomy
Conference: NIWeek 2015, August 5, 2015, Austin, TX
All rights reserved.

This presentation is a deep dive into the concepts and benefits of hardware abstraction and how implementing a hardware abstraction layer (HAL) can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, and minimizing development effort, helping you to maintain ATE for years to come.

Authors: Grant Gothing, Turnkey Systems Manager, Bloomy and Hector Guajardo Betancourt, Senior Project Engineer, Bloomy
Conference: NIWeek 2015, August 6, 2015, Austin, TX
All rights reserved.

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