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Automated Test

The Manufacturing Operator Interface (OI) component of the Bloomy EFT Module for TestStand is an end user application for running TestStand sequences. It performs many of the common actions of a TestStand OI, like loading, executing, and debugging sequences, but does so with manufacturing operators in mind.

In this video, we will provide a demonstration of how the Manufacturing Operator Interface component of the EFT module for TestStand allows manufacturing engineers and test operators to more intuitively select, execute, and debug TestStand sequences.

EFT Module for TestStand 2014 Installer (v1.0.69)

This installer contains the EFT Module for TestStand 2014 version 1.0.69, including Hardware Access Framework, Manufacturing Operator Interface, Database result processing plugin, user manuals and example sequences.

Prerequisite Installations:

  • LabVIEW 2014 (32-bit), TestStand 2014 (32-bit)

NI Device Drivers:

  • NI-DAQmx 14.0
  • NI-SWITCH 14.0
  • NI-DMM 14.0
  • NI-VISA 14.0
  • NI-DC Power 14.0 (only required for execution of example sequence)

Easing Development with DLLs in LabVIEW

March 2, 2017

As LabVIEW developers, we are comfortable developing in LabVIEW. However, sometimes we need to leverage code from other languages. This is where DLLs come in. For those of us that are less than comfortable with coding languages outside of LabVIEW, using DLLs can be daunting and frustrating. The Import Shared Library Wizard can make your life easier, however, it is not very reliable when using custom data types. This forces us to use Call Library Function nodes (CLNs) for DLL calls, which can bring up a whole bunch of problems with no intuitive debug strategy.

Category:
LabVIEW

Faster time to solution for Electronics Functional Test

The Bloomy Electronics Functional Test (EFT) Module for TestStand is a set of tools for electronics functional test sequence development, execution, and result processing using NI TestStand.

The design and development of automated test equipment (ATE) presents a host of challenges, from initial planning through hardware and software development to final integration. At each stage of the process, changes become more difficult and costly to implement. Furthermore, because software typically follows hardware in the development cycle, many open-ended items are left for the software engineer to handle.

Hardware-In-the-Loop (HIL) testing is the standard approach to validating the design of xEV ECU systems including the battery management system (BMS) electronics and firmware. HIL test systems are used to simulate the battery including cell chemistry, charging and discharging, drive cycles, and numerous fault conditions for testing the BMS; without the hazards of real batteries, or the cost of prototype vehicles and track time. There exist vendor-defined or “closed”, as well as user-defined or “open” approaches to the implementation of HIL test equipment.

Recorded at The Battery Show 2016 in Novi, MI on 9/14/2016, Bloomy's Peter Blume presents a universal approach to battery management system (BMS) manufacturing test, as well as four manufacturing test best practices. The universal approach utilizes commercial, off-the-shelf (COTS) hardware and software, including Bloomy's own Battery Simulator 1200 and Battery Fault Insertion Unit (FIU) to functionally test the BMS PCBAs prior to assembly in the battery modules and packs. Benefits include higher quality, higher production yields, and fewer defective modules and packs.

Recorded at The Battery Show 2016 in Novi, MI on 9/14/2016, Bloomy's Peter Blume presents a universal approach to battery management system (BMS) manufacturing test, as well as four manufacturing test best practices. The universal approach utilizes commercial, off-the-shelf (COTS) hardware and software, including Bloomy's own Battery Simulator 1200 and Battery Fault Insertion Unit (FIU) to functionally test the BMS PCBAs prior to assembly in the battery modules and packs. Benefits include higher quality, higher production yields, and fewer defective modules and packs.

Do you maintain multiple test systems or develop test sequences for a wide range of products? Have you ever experienced the hassles of instrumentation or platform changes? If so, hardware and measurement abstraction layers (HAL & MALs) can save you time, money, and frustration by reducing the impact of hardware changes, maximizing code reuse, and reducing development effort.  In this session Grant Gothing, Bloomy's Automated Test Equipment (ATE) R&D Manager, describes the benefits and challenges of abstraction in ATE.

Battery Test and Simulation: Top 5 things to take note of at NIWeek 2016

July 29, 2016

NIWeek 2016 kicks off Monday August 1st with the Exhibition Hall doors opening at 5:30PM. Bloomy’s BTS (Battery Test and Simulation) team has been hard at work preparing for what looks to be the most exciting NIWeek for us yet! If you plan to be at the show, here are 5 exciting things to look out for, and of course please be sure to come by our booth (Booth #205) to say hello. For those who won’t be at the show, I’ll be posting a conference summary soon after we return, with relevant links to the highlights and to materials that will have been presented.

Category:
BMS Testing

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