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Planning for ATE Success at NIDays

January 13, 2015

Bloomy supported the automated test community with informative presentations and practical exhibits at NIDays North America conferences late in 2014.  Turnkey Systems Manager Grant Gothing presented “Plan for Success with Automated Test” to standing-room-only crowds who learned best practices for creating test requirements, specifying instrumentation, defining interconnects, and selecting the right software architecture. Attendees observed the outcome of these practices with live demonstrations of Bloomy’s UTS and compactUTS products performing functional tests of printed circuit board and rigid-flex assemblies. If you missed us at NIDays you can still benefit from Grant’s presentations by attending Virtual NIDays Webcast on February 4, 2015, and/or downloading our templates for Test Requirements and Test Procedure development from our website (registration required).

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