Please visit Bloomy at this years conference. Learn about our cell simulation hardware and hardware-in-the-loop (HIL) test system for safe and efficient testing of battery management systems (BMS). Additionally, Bloomy will moderate a roundtable discussion group on BMS Test Approaches and Philosophies. Please join us.
Please join Bloomy at this years conference for a presentation on:
Cell Simulation Hardware for Safe and Efficient BMS Testing
Presented by: Peter Blume, President
Date: Thursday, April 25th from 8:10 - 9:40AM
Location: Royal Ballroom
Visit Bloomy at The Battery Show, booth #2116 in the exhibition hall.
This year at the Bloomy pavilion, booth #205 of the exhibition hall, Bloomy will showcase four innovative product demonstrations:
NI HIL Simulator System
Electronics Functional Test (EFT) Module for TestStand
BMS HIL Test System
cUTS Functional Tester
In addition, Bloomy will present the following technical sessions at this year's event:
Visit Bloomy at National Instrument's booth #1000 at the Automotive Testing Expo.
Visit Bloomy at The Battery Show, booth #2116 in the exhibition hall.
Visit Bloomy at the 23rd annual NIWeek conference presented by National Instruments.
Visit Bloomy at National Instrument's booth #1000 at the Automotive Testing Expo.
Visit Bloomy at the 22nd annual NIWeek conference presented by National Instruments
Visit Bloomy at NIDays 2015 in San Jose for NI Technology and Innovation
